Monday 22 November 2010, 10:15-12:00

Pricing and hedging of mortality-linked instruments
Helena Aro, Aalto University

Estimation of process parameters to determine the optimum diagnosis interval for control of defective items (abstract, slides)
Abhyuday Mandal, University of Georgia, USA

Monday 8 November 2010

Minimum Combined Disparity Estimation: Robustness and Efficiency (abstract)
Dr. Abhijit Mandal, University of Tampere

Monday 25 October 2010

No seminar

Monday 11 October 2010, 10:15

Dimension of the parameter space and good properties of the MLE
Esko Valkeila, Aalto University

Monday 4 October 2010

No seminar

Monday 27 September 2010, 10:15

Nonparametric partially sequential test for two sample location-scale problem for environmental monitoring (abstract)
Amitava Mukherjee, Aalto University

Monday 20 September 2010, 10:15

Simultaneous semi-sequential testing of dual alternatives for pattern recognition (abstract)
Amitava Mukherjee, Aalto University

Monday 13 September 2010, 10:15

Seminar kickoff
Esko Valkeila, Aalto University